The T probe is used to determine the rigidity properties of solid brittle products such as chips (premium vs low-cost).
The chips are placed perpendicularly to the probe on the rotary base plate of the TX-700 in order to apply the force in the middle of the sample. Then a few centimeters (5mm) compression is applied at 1mm/s to break the sample.
Using this device, equipped with the T probe, varieties of brittle products can be mechanically analyzed.
The TX-700 can be used to assess the mechanical properties of chips. We can see that there is no difference in the required force to break the chips. Therefore, low-cost chips are softer than the premium one and the break is less steep (creak). The curve irregularities come from the crackling of the product during the compression.
The TX-700 is the suitable device to test the mechanical properties of brittle products like chips. It is possible to use it in quality control but also during R&D in order to obtain the right texture for your products.